ID
PW
ȸ¿ø°¡ÀÔ
ºñ¹Ð¹øȣã±â
HOME
Products
¢º Electron Microscope
¢º TEM
¢º SEM
¢º Multi Beam
¢º Cross Section Polisher
¢º EPMA
¢º Auger Microprobe
¢º Photoelectron Spectrometer
¢º XRF Benchtop
¢º Others
¢º Magnetic Resonance Spectrometer
¢º NMR
¢º ESR
¢º Mass Spectrometer
¢º GC-MS
¢º MALDI-TOFMS
¢º LC-MS(DART-MS)
¢º MS Software
¢º Semiconductor Equipment
¢º Electron Beam Lithography
¢º TEM for Semiconductor
¢º SEM for Semiconductor
¢º Industrial Equipment
¢º Electron Beam 3D Printer
¢º Thin Film Formation Equipment
¢º Material Processing Equipment
¢º Microanalysis Systems
¢º EDS
¢º EBSD
¢º WDS
¢º Nanomanipulation
¢º Other Instruments
¢º Cressionton
¢º Gatan
¢º SPI
¢º NPGS
¢º Deben
Solutions
¢º Science Basics
¢º Find Application Notes
¢º Solutions by field
¢º Microscopic World
¢º Events / Seminars
¢º Up coming Webinars/ Seminars
¢º Up coming Events/ Exhibitions
¢º Past JEOL Webinar movies
Support
¢º Á¦Ç°°ü·Ã ¹®ÀÇ (°ßÀû/»ç¾ç)
¢º ±â¼úÆ÷·³ Q&A
¢º JEOL Korea ÀÚ·á½Ç
¢º Service °ü·Ã ¹®ÀÇ
¢º Àåºñ¿¬°£ º¸¼ö¿ë¿ª °è¾à
¢º Image Gallery
¢º Service Report
¢º ÀÚÀ¯°Ô½ÃÆÇ
About us
¢º JEOL Korea News
¢º ȸ»ç¼Ò°³
¢º ¿À½Ã´Â ±æ
¢º JEOL Korea Recruit
¢º JEOL Korea °ü·Ã Site
Home
Support - ±â¼úÆ÷·³ Q&A
Support - ±â¼úÆ÷·³ Q&A
total : 746
ÇöÀç ÆäÀÌÁö 3 / 38
706
[Electron Microscope] SEM/EDS ±³À°ÀÏÁ¤ ¹®ÀÇ
ÀÌÂùÈ£
20.01.06
199
705
[Electron Microscope] SEM/EDS ±³À°ÀÏÁ¤ ¹®ÀÇ
ÇÑ°æ¼®
20.01.06
183
704
[Electron Microscope] SEM/EDS ±³À° ¹®ÀÇ
À¯¼ºÈÆ
20.01.03
199
703
[Electron Microscope] SEM/EDS ±³À° ¹®ÀÇ
ÇÑ°æ¼®
20.01.03
137
702
[Electron Microscope] SEM/EDS ±³À°ÀÏÁ¤ ¹®ÀÇ
¹Ú»ó´ö
19.11.29
337
701
[Electron Microscope] [Electron Microscope] SEM/EDS
(1)
Ãß¼¼ö
19.11.08
316
700
[Electron Microscope] SEM/EDS ¹× FE-TEM ±³À° ÀÏÁ¤ ¹®ÀÇ
Á¤Àç¿ø
19.10.24
425
699
[Electron Microscope] SEM/EDS ±³À° ÀÏÁ¤ ¹®ÀÇ µå¸³´Ï´Ù.
Ãß¼¼ö
19.10.18
345
698
[Electron Microscope] SEM/EDS ±³À° ÀÏÁ¤ ¹®ÀÇ µå¸³´Ï´Ù.
(1)
ÇÑ°æ¼®
19.10.18
441
697
[Electron Microscope] EPMA °ü·Ã ±³À° ÀÏÁ¤ ¹× ¿öÅ©샾 µî ¹®ÀÇ
À̽ÂÈ£
19.09.16
425
696
[Electron Microscope] SEM/EDS ±³À°ÀÏÁ¤ ¹®Àǵ帳´Ï´Ù.
³ëÈñ¼±
19.08.26
352
695
[Electron Microscope] SEM/EDS ±³À°ÀÏÁ¤ ¹®Àǵ帳´Ï´Ù.
ÇÑ°æ¼®
19.08.27
352
694
[Electron Microscope] SEM/EDS Àåºñ±³À° ÀÏÁ¤ ¹®ÀÇ
ÀÓÁ¤Çõ
19.06.03
490
693
[Electron Microscope] SEM/EDS/EPMA ±³À°ÀÏÁ¤
Á¶¾Æ¶ó
19.05.14
471
692
[Electron Microscope] 2019³â SEM »ç¿ëÀÚ ±³À° ¹®ÀÇ
ÀÌÀçÈ«
19.05.07
955
691
[Electron Microscope] 2019³â SEM »ç¿ëÀÚ ±³À° ¹®ÀÇ
ÇÑ°æ¼®
19.05.07
815
690
[Electron Microscope] TEM °ü·Ã ¿öÅ©¼¥ ÀÏÁ¤ ¹®ÀÇ
¾ÈÁ¤ÈÆ
19.04.22
440
689
[Electron Microscope] SEM / TEM / EPMA Àåºñ 2019³â ±³À°ÀÏÁ¤
Â÷Áö¹Î
19.04.12
932
688
[Analysis Instruments] ESR ÀÚÀ²»ç¿ë±³À° ¹®ÀÇ
ÀÌÇöȯ
19.03.27
292
687
[Microanalysis System] ±³À°/¼¼¹Ì³ª µî ¹®ÀÇ
±èÁØ¿ì
19.03.07
355
Á¦¸ñ
³»¿ë
ÀÛ¼ºÀÚ
<<
[1]
[2]
3
[4]
[5]
[6]
[7]
[8]
[9]
[10]
>>