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Support - ±â¼úÆ÷·³ Q&A
Support - ±â¼úÆ÷·³ Q&A
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[Microanalysis System] X-ray mapping °á°ú export °ü·Ã °ÇÀÇ
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[Microanalysis System] Àå½Ã°£ X-ray ¸ÊÇÎ ¹®Á¦: JXA-8530F
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15.08.04
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[Microanalysis System] Offline correction¹®Á¦:JXA-8530F
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15.07.29
116
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[Electron Microscope] Ç¥¸é ¹Ì¼¼¿À¿°¿¡ ´ëÇÑ Çؼ®
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[Other Instruments] CP °¡°øÁ¶°Ç °ü·Ã ¹®ÀÇ
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101
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[Other Instruments] CP °¡°øÁ¶°Ç °ü·Ã ¹®ÀÇ
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[Electron Microscope] EDS°ü·Ã ¹®ÀÇ
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15.07.06
17
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[Electron Microscope] EDS°ü·Ã ¹®ÀÇ
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15.07.08
2,047
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[Electron Microscope] JEOL-6000 Mini SEM SEM & EDS
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15.06.18
40
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[Electron Microscope] JEOL-6000 Mini SEM SEM & EDS
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413
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[Microanalysis System] SEM gun alignmentÁ¶Á¤¿¡ ´ëÇØ ¹®Àǵ帳´Ï´Ù
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[Analysis Instruments] JEOL NMR probe ȣȯ¼º °ü·Ã ¹®ÀÇÀÔ´Ï´Ù.
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15.04.27
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[Electron Microscope] ¾È³çÇϽʴϰ¡? FE-EPMA ¸ÊÇΰü·Ã Áú¹®ÀÔ´Ï´Ù.
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15.03.16
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[Electron Microscope] ¾È³çÇϽʴϰ¡? FE-EPMA ¸ÊÇΰü·Ã Áú¹®ÀÔ´Ï´Ù.
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15.03.16
210
571
[Electron Microscope] EDS °ü·Ã ¹®ÀÇ
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[Electron Microscope] EDS °ü·Ã ¹®ÀÇ
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15.01.30
2,469
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[Electron Microscope] [EPMA]P-10 °¡½º °ü·Ã ¹®ÀÇ
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15.01.12
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[Electron Microscope] BSI -topo,compo image
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14.12.11
66
567
[Electron Microscope] BSI -topo,compo image
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