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    586 [Microanalysis System] X-ray mapping °á°ú export °ü·Ã °ÇÀÇ ¹Úâ±Ù 15.08.25 96
    585 [Microanalysis System] Àå½Ã°£ X-ray ¸ÊÇÎ ¹®Á¦: JXA-8530F (2) ¹Úâ±Ù 15.08.04 122
    584 [Microanalysis System] Offline correction¹®Á¦:JXA-8530F (2) ¹Úâ±Ù 15.07.29 116
    583 [Electron Microscope] Ç¥¸é ¹Ì¼¼¿À¿°¿¡ ´ëÇÑ Çؼ® ½Å¾È¼· 15.07.10 92
    582   [Electron Microscope] Ç¥¸é ¹Ì¼¼¿À¿°¿¡ ´ëÇÑ Çؼ® ¾ç°æÈ­ 15.07.13 192
    581 [Other Instruments] CP °¡°øÁ¶°Ç °ü·Ã ¹®ÀÇ (1) ¹ÚÀçÇö 15.07.10 100
    580   [Other Instruments] CP °¡°øÁ¶°Ç °ü·Ã ¹®ÀÇ ÇÑ°æ¼® 15.07.13 8
    579 [Electron Microscope] EDS°ü·Ã ¹®ÀÇ ¹ÚÁ¤ÀÓ 15.07.06 17
    578   [Electron Microscope] EDS°ü·Ã ¹®ÀÇ À¯Àç¿ì 15.07.08 1,824
    577 [Electron Microscope] JEOL-6000 Mini SEM SEM & EDS ±èâ¹Î 15.06.18 38
    576   [Electron Microscope] JEOL-6000 Mini SEM SEM & EDS ¾ç°æÈ­ 15.06.19 411
    575 [Microanalysis System] SEM gun alignmentÁ¶Á¤¿¡ ´ëÇØ ¹®Àǵ帳´Ï´Ù (2) Á¤¹Î±Ô 15.05.14 90
    574 [Analysis Instruments] JEOL NMR probe ȣȯ¼º °ü·Ã ¹®ÀÇÀÔ´Ï´Ù. (1) Â÷Áø¿í 15.04.27 109
    573 [Electron Microscope] ¾È³çÇϽʴϰ¡? FE-EPMA ¸ÊÇΰü·Ã Áú¹®ÀÔ´Ï´Ù. ¹é½ÂÈÆ 15.03.16 68
    572   [Electron Microscope] ¾È³çÇϽʴϰ¡? FE-EPMA ¸ÊÇΰü·Ã Áú¹®ÀÔ´Ï´Ù. ¾ç°æÈ­ 15.03.16 197
    571 [Electron Microscope] EDS °ü·Ã ¹®ÀÇ ¹Ú¼ºÇö 15.01.30 65
    570   [Electron Microscope] EDS °ü·Ã ¹®ÀÇ ¾ç°æÈ­ 15.01.30 2,270
    569 [Electron Microscope] [EPMA]P-10 °¡½º °ü·Ã ¹®ÀÇ (1) À̵¿¼® 15.01.12 58
    568 [Electron Microscope] BSI -topo,compo image °í¼®¿¬ 14.12.11 61
    567   [Electron Microscope] BSI -topo,compo image ¾ç°æÈ­ 14.12.17 145
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